Enabling Targeted Inspection Procedures to Reduce Ultrafine Particle Emissions: Advanced Analytics Applied to the Enforcement of the APU Ban at Amsterdam Airport Schiphol

Additional Metadata
Keywords	data analytics for enabling more targeted inspectins, APU ban at Schiphol Airport, machine learning
Thesis Advisor	van Dalen, Jan, Veelenturf, Luuk
Persistent URL	hdl.handle.net/2105/73961
Series	Business Analytics & Management
Organisation	Rotterdam School of Management
Citation APA APA Style APA-ALL Style AAA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Beek, Hans. (2024). Enabling Targeted Inspection Procedures to Reduce Ultrafine Particle Emissions: Advanced Analytics Applied to the Enforcement of the APU Ban at Amsterdam Airport Schiphol. In Business Analytics & Management.http://hdl.handle.net/2105/73961

Publication